CVE-2025-21423
Essential information
- Published
- 07/04/2025 11:15
- Modified
- 07/04/2025 14:17
- Author
- —
- Creator
- —
- CVSS
- 7.8 HIGH (v3.1)
- CISA KEV
- No
- CWE
- —
- CVSS vector
-
—
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H—
CVSS metrics
- Access vector
- —
- Access complexity
- —
- Authentication
- —
- Confidentiality impact
- —
- Integrity impact
- —
- Availability impact
- —
- Exploitability
- —
- Remediation level
- —
- Report confidence
- —
- Temporal score
- —
- Attack vector
- LOCAL
- Attack complexity
- LOW
- Privileges required
- LOW
- User interaction
- NONE
- Scope
- UNCHANGED
- Confidentiality impact
- HIGH
- Integrity impact
- HIGH
- Availability impact
- HIGH
- Exploit code maturity
- —
- Remediation level
- —
- Report confidence
- —
- Temporal score
- —
- Attack vector
- —
- Attack complexity
- —
- Attack requirements
- —
- Privileges required
- —
- User interaction
- —
- Confidentiality (V)
- —
- Confidentiality (S)
- —
- Integrity (V)
- —
- Integrity (S)
- —
- Availability (V)
- —
- Availability (S)
- —
- Exploit maturity
- —
Description
Memory corruption occurs when handling client calls to EnableTestMode through an Escape call.
NVD status
- Status
- Awaiting Analysis — CVE has been recently published to the CVE List and has been received by the NVD.
- Source
- [email protected]
- NVD
- View on NVD
Affected products (CPE)
| Product | CPE |
|---|---|
| qualcomm / qualcomm product | cpe:2.3:a:qualcomm:qualcomm_product:*:*:*:*:*:*:*:* |