CVE-2024-53017
Essential information
- Published
- 03/06/2025 06:15
- Modified
- 04/06/2025 14:54
- Author
- —
- Creator
- —
- CVSS
- 6.6 MEDIUM (v3.1)
- CISA KEV
- No
- CWE
- —
- CVSS vector
-
—
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L—
CVSS metrics
- Access vector
- —
- Access complexity
- —
- Authentication
- —
- Confidentiality impact
- —
- Integrity impact
- —
- Availability impact
- —
- Exploitability
- —
- Remediation level
- —
- Report confidence
- —
- Temporal score
- —
- Attack vector
- LOCAL
- Attack complexity
- LOW
- Privileges required
- LOW
- User interaction
- NONE
- Scope
- UNCHANGED
- Confidentiality impact
- LOW
- Integrity impact
- HIGH
- Availability impact
- LOW
- Exploit code maturity
- —
- Remediation level
- —
- Report confidence
- —
- Temporal score
- —
- Attack vector
- —
- Attack complexity
- —
- Attack requirements
- —
- Privileges required
- —
- User interaction
- —
- Confidentiality (V)
- —
- Confidentiality (S)
- —
- Integrity (V)
- —
- Integrity (S)
- —
- Availability (V)
- —
- Availability (S)
- —
- Exploit maturity
- —
Description
Memory corruption while handling test pattern generator IOCTL command.
NVD status
- Status
- Awaiting Analysis — CVE has been recently published to the CVE List and has been received by the NVD.
- Source
- [email protected]
- NVD
- View on NVD
Affected products (CPE)
| Product | CPE |
|---|---|
| qualcomm / test pattern generator | cpe:2.3:a:qualcomm:test_pattern_generator:*:*:*:*:*:*:*:* |